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Figure 3
(a) Normalized XAS data measured at room temperature near the Ni K-edges of Ba2La2NiW2O12, Sr2La2NiW2O12, standard Ni0 foil, and standard Ni2+O. The inset displays a close up of the edge position. (b) The Fourier transformed EXAFS component, with peaks corresponding to distances from Ni to neighboring pairs, are labeled in the figure.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
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