Importance of powder diffraction raw data archival in a curated database for materials science applications

Kabekkodu, S.; Blanton, T.

doi:10.1107/S2052520624006607

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 5
Comparison of NIST SRM 1976 plate PXRD patterns fixed versus variable slits. Notice the difference in the relative intensities (marked in the figure).

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 80| Part 5| October 2024| Pages 364-369

https://doi.org/10.1107/S2052520624006607

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