Floating zone growth of high-purity MgO substrate single crystals

Guguschev, C.; Schulze, M.; Dittmar, A.; Klimm, D.; Dadzis, K.; Schroeder, T.; Peters, K.; Pushp, A.

doi:10.1107/S2052520625010893

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 11
Selected µ-XRF element mapping results for Mg, Ca, Fe, Cr, V, Mn, Ti and Zn for a polished substrate sample of crystal M1 (top rows). It is evident that a fraction of the seed used is part of the polished substrate. The spectrum (bottom) measured at the seed region is compared with a spectrum of the grown crystal. The locations of the sum spectra of the different areas (crystal, seed) are indicated in the inset.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 82| Part 1| February 2026| Pages 2-13

https://doi.org/10.1107/S2052520625010893

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