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Figure 9
(a) (top) STEM HAADF survey image of the EDS mapped region, bottom, the corresponding integrated profiles of the chemical composition showing repetitive patterns for Al and N signals. (b) (top) Cropped integrated profiles to compare it to our atomic model as presented in Fig. 4[link]. EDS measured in one single scan; the signal is integrated over a width of 10 nm as indicated by the gray arrow on the HAADF survey image.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 82| Part 3| June 2026| Pages 299-309
https://doi.org/10.1107/S2052520626002544
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