Silicon allotropes by large-volume high-pressure techniques: crystal growth mechanisms, phase diagrams and hexagonal nanostructured Si-6H by in situ X-ray diffraction and computational methods

Courac, A.; Le Godec, Y.

doi:10.1107/S2052520626004026

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 5
Typical in situ X-ray diffraction data on crystallization of Si-III with BC8 structure by direct phase transformations Si-I → Si-II → Si-III (inserts show corresponding crystal structures) (a); and (b) raw data of observation of Na₄Si₂₄ formation by the sequence of chemical reactions: Si-I (+Na) → Si-I (+ Na₄Si₄) → Na_30.5Si₁₃₆ → Na₄Si₄ (+ Si-II) obtained at beamline ID06 of ESRF.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 82| Part 3| June 2026| Pages 280-298

https://doi.org/10.1107/S2052520626004026

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