Structural and magnetic investigations of the Weyl semimetal family CeAlSi1–xGex

Mayoh, D.A.; Sharma, S.; Chamberlain, T.W.; Wood, G.D.A.; da-Silva, I.; Goddard, P.A.; Lees, M.R.; Balakrishnan, G.

doi:10.1107/S2052520626002635

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 2
Crystals of (a) CeAlSi and (b) CeAlGe grown using the flux method. Below each image is the corresponding Laue diffraction pattern obtained by back-scattering X-rays from the largest crystal face. The observed fourfold symmetry indicates that the diffraction pattern corresponds to the [001] crystallographic direction, confirming that the largest face is perpendicular to the c axis of the crystal.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 82| Part 3| June 2026| Pages 250-257

https://doi.org/10.1107/S2052520626002635

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