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Figure 3
(a) Room-temperature powder X-ray diffraction pattern of a CeAlSi0.5Ge0.5 collected with a Co target (λ = 1.7902 Å). The experimental profile (green circles), the Rietveld refinement of the data (blue line) and the difference between the two (red line) are shown. Also shown are the expected Bragg peaks indicated by the purple vertical lines. (b) Unit-cell parameters a and c, and unit-cell volume V, as a function of Ge concentration x for CeAlSi1–xGex.

Journal logoSTRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS
ISSN: 2052-5206
Volume 82| Part 3| June 2026| Pages 250-257
https://doi.org/10.1107/S2052520626002635
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