Structural and magnetic investigations of the Weyl semimetal family CeAlSi1–xGex

Mayoh, D.A.; Sharma, S.; Chamberlain, T.W.; Wood, G.D.A.; da-Silva, I.; Goddard, P.A.; Lees, M.R.; Balakrishnan, G.

doi:10.1107/S2052520626002635

Acta Crystallographica Section B
Acta Crystallographica
Section B STRUCTURAL SCIENCE, CRYSTAL ENGINEERING AND MATERIALS

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Figure 5
Powder X-ray diffraction data for CeAlSi collected with a Mo source (λ_Kα1 = 0.7093 and λ_Kα2 = 0.7135 Å) at selected temperatures from 20 to 310 K, highlighting the shift in the (215) peak.

STRUCTURAL SCIENCE
CRYSTAL ENGINEERING
MATERIALS

ISSN: 2052-5206

Volume 82| Part 3| June 2026| Pages 250-257

https://doi.org/10.1107/S2052520626002635

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