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Figure 1
X-ray Rietveld refinement profiles for Sr2+xMg3−xP4O15 (x ∼ 0.36), including the minor impurity phases, recorded at room temperature. The crossed line marks experimental points and the solid line is the calculated profile. The bottom trace shows the difference curve and the ticks denote expected peak positions for Sr2+xMg3−xP4O15 (x ∼ 0.36), Mg2P2O7 and Mg3P2O8, in order from the bottom.

Journal logoSTRUCTURAL
CHEMISTRY
ISSN: 2053-2296
Volume 67| Part 1| December 2011| Pages i1-i3
doi:10.1107/S0108270110047967
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