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Figure 2
Rietveld plot for the m-CPPM phase based on the powder XRD pattern. Observed data points are indicated by dots, and the best-fit profile (upper trace) and the difference pattern (lower trace) are solid lines. The vertical bars indicate the positions of the Bragg peaks.

Journal logoSTRUCTURAL
CHEMISTRY
ISSN: 2053-2296
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