The polyocta­hedral silsesquioxane (POSS) 1,3,5,7,9,11,13,15-octa­phenyl­penta­cyclo­[9.5.1.13,9.15,15.17,13]octa­siloxane (octa­phenyl-POSS)

Chinnam, P.R.; Gau, M.R.; Schwab, J.; Zdilla, M.J.; Wunder, S.L.

doi:10.1107/S2053229614019834

Acta Crystallographica Section C
Acta Crystallographica
Section C STRUCTURAL CHEMISTRY

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Figure 4
Comparison of the powder X-ray diffraction pattern generated from single-crystal data reported here (Theory) and the measured powder patterns of commercial octaphenyl-POSS (Ph₈T₈) and the tetrol Si₄O₄(Ph)₄(OH)₄ (Ph₄T₄OH).

STRUCTURAL
CHEMISTRY

ISSN: 2053-2296

Volume 70| Part 10| September 2014| Pages 971-974

doi:10.1107/S2053229614019834

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