Hirshfeld surface analysis of sulfameter (polymorph III), sulfameter dioxane monosolvate and sulfameter tetra­hydro­furan monosolvate, all at 296 K

Tailor, S.M.; Patel, U.H.

doi:10.1107/S2053229615017520

Acta Crystallographica Section C
Acta Crystallographica
Section C STRUCTURAL CHEMISTRY

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Figure 2
Structural overlays of the SMT groups. (a) Compound (1)

[sulfameter molecules A (red) and B (blue)], with a root-mean-square deviation (r.m.s.d.) of the overlay fit of 0.7984 Å. (b) Compounds (2)

and (3)

[sulfameter dioxane monosolvate (purple) and sulfameter tetrahydrofuran monosolvate (green)], with an r.m.s.d. of the overlay fit of 0.1060 Å. (c) Molecule A of (1)

with compounds (2)

and (3)

, with r.m.s.d.'s of the overlay fit between (1)

and (2)

of 0.1907 Å and between (1)

and (3)

of 0.1061 Å. (d) Molecule B of (1)

with compounds (2)

and (3)

, with r.m.s.d.'s of the overlay fit between (1)

and (2)

of 0.8656 Å and between (1)

and (3)

of 0.8258 Å.

STRUCTURAL
CHEMISTRY

ISSN: 2053-2296

Volume 71| Part 11| October 2015| Pages 944-953

doi:10.1107/S2053229615017520

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