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Figure 4
Final Rietveld fit for UOW-10 using the 3D ED structure against syn­chro­tron powder X-ray diffraction data [λ = 0.8249705 (3) Å]. See text for refined lattice parameters.

Journal logoSTRUCTURAL
CHEMISTRY
ISSN: 2053-2296
Volume 82| Part 3| March 2026| Pages 102-109
https://doi.org/10.1107/S205322962600077X
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