Figure 1
Three-layer device layout. (a) Schematic representation of chip layers. (b) Cut-away view of the imaging chamber of the assembled chip with a 150 nm thick silicon nitride window, 15 µm thick photoresist and 8 µm thick Kapton film layer. (c) 100 mm diameter wafer patterned with 24 5 × 30 mm devices. (d) Photograph of a single 5 × 30 mm device (silicon nitride layer only). |