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![[Figure 6]](gm5039fig6mag.jpg)
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Figure 6
Comparison of background scattering between silicon nitride-based and PDMS-based devices. (a) Diffraction image from a three-layer (silicon nitride window, 15 µm thick photoresist and Kapton film) device containing crystallization buffer. The dark scattering ring at 16 Å resolution derives from the Kapton film. (b) Diffraction image from a ∼100 µm thick two-layer microfluidic PDMS crystal capture device loaded with crystallization buffer. (c) Plot of scattering intensity versus resolution for the images shown in (a) and (b). The cone-shaped dark area to the left of the beamstop corresponds to the part of the diffraction image where X-rays were not blocked by the X-ray scatter guard. Data for (c) were smoothed to remove sharp features caused by these unblocked X-rays. |
![[Figure 6]](gm5039fig6.jpg)
 | STRUCTURAL BIOLOGY |
ISSN: 2059-7983
