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Figure 2
EIGER count-rate performance. The measured count rate is plotted against the incoming rate for 12.4 keV X-rays. The solid line is a fit to the measured data with the equation Iobs = I0exp(−I0 × τ), where Iobs is the detected count rate, I0 is the true incident count rate and τ is the energy-dependent dead time of the counter. On this plot, an estimation of the count rate of a reflection with 10 photons for each of the different speed data sets (see §[link]3.3 and Fig. 9[link]) is marked.

Journal logoSTRUCTURAL
ISSN: 2059-7983
Volume 72| Part 9| September 2016| Pages 1036-1048
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