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![[Figure 1]](xh5066fig1mag.jpg)
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Figure 1
The typical beam profile of the top-hat beam at the P14 beamline is shown. The profile was measured using an Optique Peter (Lentilly, France) X-ray microscope. The effective pixel size is 0.65 µm. Slit diffraction features are visible at the edges of the beam. We therefore used a beam that was slightly larger than the crystal to account for the slit diffraction features. |
![[Figure 1]](xh5066fig1.jpg)
 | STRUCTURAL BIOLOGY |
ISSN: 2059-7983
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