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Figure 3 The Rietveld plot, showing the observed (circles), calculated (line) and difference patterns for (I). The reflection positions are shown above the difference pattern.

Journal logoCRYSTALLOGRAPHIC
COMMUNICATIONS
ISSN: 2056-9890
Volume 64| Part 8| July 2008| Pages m1044-m1045
doi:10.1107/S1600536808022137
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