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Figure 2 Rietveld refinement for X-ray diffraction data. Observed (crosses), calculated (solid line) and difference (bottom trace) plots are represented; vertical marks correspond to the allowed Bragg reflections for Y2GeO5 (top) and Y2Ge2O7 (bottom) as secondary phase.

Journal logoCRYSTALLOGRAPHIC
COMMUNICATIONS
ISSN: 2056-9890
Volume 65| Part 8| July 2009| Page i60
doi:10.1107/S1600536809026579
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