organic compounds\(\def\hfill{\hskip 5em}\def\hfil{\hskip 3em}\def\eqno#1{\hfil {#1}}\)

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ISSN: 2056-9890

Thieno[3,4-d][1,3]di­thiole-2-thione

aSchool of Chemistry and Chemical Engineering, Shandong University, Jinan 250100, People's Republic of China, and bState Key Laboratory of Crystal Materials, Shandong University, Jinan 250100, People's Republic of China
*Correspondence e-mail: fangqi@sdu.edu.cn

(Received 26 September 2011; accepted 24 October 2011; online 29 October 2011)

In the title compound, C5H2S4, the terminal monocyclic S atom deviates by 0.117 (1) Å from the mean plane of the other non-H atoms (r.m.s. deviation = 0.001 Å). All six C—S bonds and the central C—C bond in the rings are characterized by π-conjugated lengths, endowing the mol­ecule with high π-conjugation. In the crystal, the mol­ecules are parallel packed, forming columnar stacks along the a axis. Short inter­molecular S⋯S contacts [3.397 (1) and 3.486 (1) Å], are observed.

Related literature

For details of the synthesis, see: Chiang et al. (1983[Chiang, L.-Y., Shu, P., Holt, D. & Cowan, D. (1983). J. Org. Chem. 48, 4713-4717.]); Gronowitz & Moses (1962[Gronowitz, S. & Moses, P. (1962). Acta Chem. Scand. 16, 105-110.]). For DFT calculations using GAUSSIAN, see: Frisch et al. (2003[Frisch, M. J., et al. (2003). GAUSSIAN03. Gaussian Inc., Pittsburgh, PA, USA.]).

[Scheme 1]

Experimental

Crystal data
  • C5H2S4

  • Mr = 190.31

  • Orthorhombic, P 21 21 21

  • a = 3.9425 (1) Å

  • b = 9.2588 (2) Å

  • c = 19.2368 (3) Å

  • V = 702.20 (3) Å3

  • Z = 4

  • Mo Kα radiation

  • μ = 1.25 mm−1

  • T = 294 K

  • 0.20 × 0.06 × 0.03 mm

Data collection
  • Bruker APEX2 CCD area-detector diffractometer

  • Absorption correction: multi-scan (SADABS; Bruker, 2005[Bruker (2005). APEX2, SAINT and SADABS. Bruker AXS Inc., Madison, Wisconsin, USA.]) Tmin = 0.792, Tmax = 0.962

  • 17824 measured reflections

  • 1601 independent reflections

  • 1486 reflections with I > 2σ(I)

  • Rint = 0.030

Refinement
  • R[F2 > 2σ(F2)] = 0.021

  • wR(F2) = 0.053

  • S = 1.05

  • 1601 reflections

  • 90 parameters

  • All H-atom parameters refined

  • Δρmax = 0.25 e Å−3

  • Δρmin = −0.13 e Å−3

  • Absolute structure: Flack (1983[Flack, H. D. (1983). Acta Cryst. A39, 876-881.]), 618 Friedel pairs

  • Flack parameter: 0.18 (10)

Data collection: APEX2 (Bruker, 2005[Bruker (2005). APEX2, SAINT and SADABS. Bruker AXS Inc., Madison, Wisconsin, USA.]); cell refinement: SAINT (Bruker, 2005[Bruker (2005). APEX2, SAINT and SADABS. Bruker AXS Inc., Madison, Wisconsin, USA.]); data reduction: SAINT; program(s) used to solve structure: SHELXS97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); molecular graphics: SHELXTL (Sheldrick, 2008[Sheldrick, G. M. (2008). Acta Cryst. A64, 112-122.]); software used to prepare material for publication: SHELXL97.

Supporting information


Comment top

Although the synthesis of the title compound was reported early by Gronowitz & Moses, 1962, there is no report about its crystal structure. We have recently re-synthesized this compound and determined its X-ray structure.

The molecule adopts a nearly planar C2v conformation (see below for details). All the C—S bond lengths, from the longest 1.744 (2)Å to the shortest 1.635 (2) Å, are between the lengths of C—S single bond and CS double bond. The central CC bond, shared by the two fused five-member rings, also features a delocalized bond with its length being 1.430 (2) Å. Thus the molecule is characterized by a highly planar π-conjugation.

The molecules pack in a paralleled way along the a axis, forming columnar stacks along this direction. The molecular packing is also characterized by many short intermolecular S···S contacts (for instance, S2···S2 [-1/2 + x, 1/2 - y, -z] and S3···S4 [1 - x, -1/2 + y, 1/2 - z] distances are 3.397 (1)Å and 3.486 (1) Å, respectively). We believe that this kind of S···S intermolecular interactions helps to stabilitate the molecular packing in the crystal.

The terminal S4 atom deviates by 0.117 (1)Å from the least-squares plane through the other eight non-H atoms (C1, C2, C3, C4, C5, S1, S2, S3). We suppose that this deviation may be the result of the above S···S intermolecular interactions. To support this assumption, we carried out an optimization procedure for the molecular conformation by using the Gaussian-03 programs (Frisch et al., 2003) within the framework of the DFT at the B3LYP/6–311(d) level. The optimized "free" molecule indeed adopts a perfect planar conformation with a strict C2v symmetry. All the theoretical bond parameters are in good agreement with those of the X-ray results.

Related literature top

For details of the synthesis, see: Chiang et al. (1983); Gronowitz & Moses (1962). For DFT calculations using GAUSSIAN, see: Frisch et al. (2003).

Experimental top

The title compound was synthesized by a similar procedure to Chiang et al. (1983). 3,4-Dibromothiophene (2.18 g, 9.0 mmol) was dissolved in 30 ml anhydrous diethyl ether and stirred in the presence of N2 at 195 K while n-butyllithium (5.6 ml, 9.0 mmol, 1.6 M in hexane) was added via syringe. Stirring was continued for 0.5 h, then sulfur (0.288 g, 9.0 mmol) was added. The reaction mixture was stirred for 1 h, and n -butyllithium (5.6 ml, 9.0 mmol) was added via syringe. After being stirred for 0.5 h, sulfur (0.288 g, 9.0 mmol) was added to the yellow solution. After 1 h, the reaction mixture was allowed to come to r.t. and was dried in vacuo. After removal of the solvent, 2 M sodium hydroxide solution (20 ml) and carbon disulfide (12 ml) were added. The mixture was refluxed under N2 at 363 K for 4 h. And then the solution was stirred overnight at r.t.. The excess of carbon disulfide was removed in vacuo. Filtration of the mixture gave a yellow solid. Recrytallization of the solid from dichloromethane-hexane (1:5, v/v) gave 0.26 g (15% yield) of the compound. Crystals were grown by slow evaporation of a dichloromethane solution.

Refinement top

Both H atoms were located in a difference Fourier map and freely refined in isotropic approximation, leading to C—H distances 0.88 (2), 0.94 (2) Å and Uiso 0.045 (5), 0.060 (7)Å-1.

Computing details top

Data collection: APEX2 (Bruker, 2005); cell refinement: SAINT (Bruker, 2005); data reduction: SAINT (Bruker, 2005); program(s) used to solve structure: SHELXS97 (Sheldrick, 2008); program(s) used to refine structure: SHELXL97 (Sheldrick, 2008); molecular graphics: SHELXTL (Sheldrick, 2008); software used to prepare material for publication: SHELXL97 (Sheldrick, 2008).

Figures top
[Figure 1] Fig. 1. Molecular structure of the title compound. Displacement elliposoid is drawn at 50% probability level.
[Figure 2] Fig. 2. The packing of the molecules in title crystal viewed down the a axis, showing the column structure along this direction and S···S intermolecular short contacts between neighboring columns.
Thieno[3,4-d][1,3]dithiole-2-thione top
Crystal data top
C5H2S4F(000) = 384
Mr = 190.31Dx = 1.800 Mg m3
Orthorhombic, P212121Mo Kα radiation, λ = 0.71073 Å
Hall symbol: P 2ac 2abCell parameters from 6079 reflections
a = 3.9425 (1) Åθ = 2.4–26.6°
b = 9.2588 (2) ŵ = 1.25 mm1
c = 19.2368 (3) ÅT = 294 K
V = 702.20 (3) Å3Bar, yellow
Z = 40.20 × 0.06 × 0.03 mm
Data collection top
Bruker APEX2 CCD area-detector
diffractometer
1601 independent reflections
Radiation source: fine-focus sealed tube1486 reflections with I > 2σ(I)
Graphite monochromatorRint = 0.030
Detector resolution: 8.3 pixels mm-1θmax = 27.5°, θmin = 2.4°
phi and ω scansh = 55
Absorption correction: multi-scan
(SADABS; Bruker, 2005)
k = 1212
Tmin = 0.792, Tmax = 0.962l = 2425
17824 measured reflections
Refinement top
Refinement on F2Secondary atom site location: difference Fourier map
Least-squares matrix: fullHydrogen site location: difference Fourier map
R[F2 > 2σ(F2)] = 0.021All H-atom parameters refined
wR(F2) = 0.053 w = 1/[σ2(Fo2) + (0.0337P)2 + 0.0176P]
where P = (Fo2 + 2Fc2)/3
S = 1.05(Δ/σ)max < 0.001
1601 reflectionsΔρmax = 0.25 e Å3
90 parametersΔρmin = 0.13 e Å3
0 restraintsAbsolute structure: Flack (1983), 618 Friedel pairs
Primary atom site location: structure-invariant direct methodsAbsolute structure parameter: 0.18 (10)
Crystal data top
C5H2S4V = 702.20 (3) Å3
Mr = 190.31Z = 4
Orthorhombic, P212121Mo Kα radiation
a = 3.9425 (1) ŵ = 1.25 mm1
b = 9.2588 (2) ÅT = 294 K
c = 19.2368 (3) Å0.20 × 0.06 × 0.03 mm
Data collection top
Bruker APEX2 CCD area-detector
diffractometer
1601 independent reflections
Absorption correction: multi-scan
(SADABS; Bruker, 2005)
1486 reflections with I > 2σ(I)
Tmin = 0.792, Tmax = 0.962Rint = 0.030
17824 measured reflections
Refinement top
R[F2 > 2σ(F2)] = 0.021All H-atom parameters refined
wR(F2) = 0.053Δρmax = 0.25 e Å3
S = 1.05Δρmin = 0.13 e Å3
1601 reflectionsAbsolute structure: Flack (1983), 618 Friedel pairs
90 parametersAbsolute structure parameter: 0.18 (10)
0 restraints
Special details top

Experimental. Scan width 0.5° ω, Crystal to detector distance 5.96 cm

Geometry. All e.s.d.'s (except the e.s.d. in the dihedral angle between two l.s. planes)

are estimated using the full covariance matrix. The cell e.s.d.'s are taken

into account individually in the estimation of e.s.d.'s in distances, angles

and torsion angles; correlations between e.s.d.'s in cell parameters are only

used when they are defined by crystal symmetry. An approximate (isotropic)

treatment of cell e.s.d.'s is used for estimating e.s.d.'s involving l.s. planes.

Refinement. Refinement of F2 against ALL reflections. The weighted R-factor wR and goodness of fit S are based on F2, conventional R-factors R are based on F, with F set to zero for negative F2. The threshold expression of F2 > σ(F2) is used only for calculating R-factors(gt) etc. and is not relevant to the choice of reflections for refinement. R-factors based on F2 are statistically about twice as large as those based on F, and R- factors based on ALL data will be even larger.

Fractional atomic coordinates and isotropic or equivalent isotropic displacement parameters (Å2) top
xyzUiso*/Ueq
S10.00458 (13)0.19316 (5)0.07833 (3)0.04533 (13)
S20.01295 (11)0.26695 (5)0.07145 (2)0.03376 (11)
S30.28209 (12)0.16829 (5)0.20312 (2)0.03822 (12)
S40.25260 (16)0.48015 (5)0.17223 (3)0.05033 (14)
C10.0743 (5)0.0312 (2)0.03940 (10)0.0403 (4)
C20.0144 (4)0.08048 (18)0.08177 (8)0.0306 (3)
C30.1522 (4)0.03202 (19)0.14643 (9)0.0321 (3)
C40.1774 (4)0.31270 (18)0.15017 (8)0.0313 (4)
C50.1610 (5)0.1139 (2)0.15177 (11)0.0415 (4)
H10.168 (5)0.030 (2)0.0057 (13)0.060 (7)*
H20.230 (5)0.162 (2)0.1886 (10)0.045 (5)*
Atomic displacement parameters (Å2) top
U11U22U33U12U13U23
S10.0560 (3)0.0293 (2)0.0507 (3)0.0022 (2)0.0044 (3)0.00404 (19)
S20.0428 (2)0.0297 (2)0.0288 (2)0.0009 (2)0.00395 (19)0.00159 (16)
S30.0476 (2)0.0372 (2)0.0299 (2)0.0011 (2)0.00840 (19)0.00048 (17)
S40.0692 (3)0.0328 (2)0.0490 (3)0.0045 (3)0.0055 (3)0.0084 (2)
C10.0485 (11)0.0348 (9)0.0377 (10)0.0017 (9)0.0078 (8)0.0023 (8)
C20.0331 (8)0.0292 (8)0.0296 (8)0.0024 (7)0.0005 (8)0.0003 (6)
C30.0336 (8)0.0323 (9)0.0303 (8)0.0014 (7)0.0015 (6)0.0023 (7)
C40.0323 (8)0.0327 (9)0.0289 (8)0.0002 (7)0.0016 (6)0.0017 (7)
C50.0527 (11)0.0326 (10)0.0391 (10)0.0054 (8)0.0018 (8)0.0027 (8)
Geometric parameters (Å, º) top
S1—C11.705 (2)S4—C41.6345 (17)
S1—C51.707 (2)C2—C11.362 (2)
S2—C21.7412 (17)C2—C31.429 (2)
S2—C41.7422 (17)C3—C51.355 (2)
S3—C41.7308 (17)C5—H20.879 (19)
S3—C31.7445 (18)C1—H10.94 (2)
C1—S1—C592.94 (9)C3—C5—S1110.88 (15)
C2—S2—C496.62 (8)C3—C5—H2125.0 (13)
C4—S3—C396.94 (8)S1—C5—H2124.0 (12)
C1—C2—C3112.34 (16)C2—C1—S1110.97 (14)
C1—C2—S2131.94 (14)C2—C1—H1129.9 (14)
C3—C2—S2115.72 (12)S1—C1—H1119.2 (14)
C5—C3—C2112.87 (17)S4—C4—S3122.45 (10)
C5—C3—S3131.76 (15)S4—C4—S2122.31 (10)
C2—C3—S3115.37 (13)S3—C4—S2115.24 (9)
C4—S2—C2—C1177.48 (19)S3—C3—C5—S1178.73 (11)
C4—S2—C2—C33.09 (15)C1—S1—C5—C30.08 (16)
C1—C2—C3—C50.7 (2)C3—C2—C1—S10.7 (2)
S2—C2—C3—C5178.87 (14)S2—C2—C1—S1178.73 (12)
C1—C2—C3—S3178.54 (13)C5—S1—C1—C20.46 (16)
S2—C2—C3—S31.92 (18)C3—S3—C4—S4177.35 (11)
C4—S3—C3—C5178.7 (2)C3—S3—C4—S22.45 (10)
C4—S3—C3—C20.32 (14)C2—S2—C4—S4176.50 (11)
C2—C3—C5—S10.3 (2)C2—S2—C4—S33.29 (11)

Experimental details

Crystal data
Chemical formulaC5H2S4
Mr190.31
Crystal system, space groupOrthorhombic, P212121
Temperature (K)294
a, b, c (Å)3.9425 (1), 9.2588 (2), 19.2368 (3)
V3)702.20 (3)
Z4
Radiation typeMo Kα
µ (mm1)1.25
Crystal size (mm)0.20 × 0.06 × 0.03
Data collection
DiffractometerBruker APEX2 CCD area-detector
diffractometer
Absorption correctionMulti-scan
(SADABS; Bruker, 2005)
Tmin, Tmax0.792, 0.962
No. of measured, independent and
observed [I > 2σ(I)] reflections
17824, 1601, 1486
Rint0.030
(sin θ/λ)max1)0.649
Refinement
R[F2 > 2σ(F2)], wR(F2), S 0.021, 0.053, 1.05
No. of reflections1601
No. of parameters90
H-atom treatmentAll H-atom parameters refined
Δρmax, Δρmin (e Å3)0.25, 0.13
Absolute structureFlack (1983), 618 Friedel pairs
Absolute structure parameter0.18 (10)

Computer programs: APEX2 (Bruker, 2005), SAINT (Bruker, 2005), SHELXS97 (Sheldrick, 2008), SHELXL97 (Sheldrick, 2008), SHELXTL (Sheldrick, 2008).

 

Acknowledgements

This work was supported by the National Natural Science Foundation of China (grant Nos. 50673054 and 20972089).

References

First citationBruker (2005). APEX2, SAINT and SADABS. Bruker AXS Inc., Madison, Wisconsin, USA.  Google Scholar
First citationChiang, L.-Y., Shu, P., Holt, D. & Cowan, D. (1983). J. Org. Chem. 48, 4713–4717.  CrossRef CAS Web of Science Google Scholar
First citationFlack, H. D. (1983). Acta Cryst. A39, 876–881.  CrossRef CAS Web of Science IUCr Journals Google Scholar
First citationFrisch, M. J., et al. (2003). GAUSSIAN03. Gaussian Inc., Pittsburgh, PA, USA.  Google Scholar
First citationGronowitz, S. & Moses, P. (1962). Acta Chem. Scand. 16, 105–110.  CrossRef CAS Web of Science Google Scholar
First citationSheldrick, G. M. (2008). Acta Cryst. A64, 112–122.  Web of Science CrossRef CAS IUCr Journals Google Scholar

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ISSN: 2056-9890
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