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Figure 4 Scattered X-ray intensities of title compound at ambient conditions as a function of diffraction angle 2θ. The observed pattern (red dots), the best Rietveld fit profiles (line) and the difference curve between the observed and calculated profiles (below) are shown.

Journal logoCRYSTALLOGRAPHIC
COMMUNICATIONS
ISSN: 2056-9890
Volume 69| Part 11| October 2013| Page o1677
doi:10.1107/S1600536813028353
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