Crystal structure of Na2HfSi2O7 by Rietveld refinement

Massoni, N.; Chevreux, P.

doi:10.1107/S2056989016014225

Acta Crystallographica Section E
Acta Crystallographica
Section E CRYSTALLOGRAPHIC COMMUNICATIONS

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Figure 2
Comparison of observed (red squares) and calculated (solid line) intensities for Na₂HfSi₂O₇. The difference pattern appears below. Inset: focus on the 12–35° 2θ range.

CRYSTALLOGRAPHIC
COMMUNICATIONS

ISSN: 2056-9890

Volume 72| Part 10| October 2016| Pages 1434-1437

https://doi.org/10.1107/S2056989016014225

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