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Figure 5
XRD pattern (λ = 0.373811 Å) of (NH4)3Al2(PO4)3 synthesized ionothermally in ethyl tri­butyl­phospho­nium di­ethyl­phosphate and Rietveld residuals following structure refinement. Part A shows the fit to the overall pattern, and inset B shows the fit to high-angle regions.

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