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Figure 4
SEM micrographs of KRE(MoO4)2. Artifacts on the surface of several crystals shown resemble residual flux not fully removed during rinsing.

Journal logoCRYSTALLOGRAPHIC
COMMUNICATIONS
ISSN: 2056-9890
Volume 76| Part 12| December 2020| Pages 1871-1875
https://doi.org/10.1107/S205698902001542X
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