view article

Figure 1
Powder X-ray diffraction pattern and Rietveld refinement of NbF5: measured data points (black dots), calculated diffraction pattern (red line), background (green line) and difference curve (gray). The calculated reflection positions are indicated by the vertical bars at the bottom. Rp = 3.08, Rwp = 4.25%, RBragg = 1.32%, S = 1.77.

ISSN: 2056-9890
Follow Acta Cryst. E
Sign up for e-alerts
Follow Acta Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds