Defect recognition and image processing in semiconductors 1997, Institute of Physics Conference Series, Number 160. Edited by J. Donecker and I. Rechenberg. Pp. xx + 524. Bristol and Philadelphia: Institute of Physics Publishing, 1998. Price £135, US $270. ISBN 0 7503 0500 2.

The book is number 160 in the Institute of Physics Conference Series. It contains the refereed collected proceedings of the Seventh International Conference on the title topic (DRIP VII), held in Templin, Germany, 7–10 September 1997. DRIP conferences `consider defects from the atomic scale up to inhomogeneities in complete wafers from the experimental point of view'.