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 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
High-energy X-ray diffuse scattering using Weissenberg flat-cone geometry. Erratum
aPhysical and Chemical Properties Division, National Institute of Standards and Technology, Boulder, Colorado 80303, USA, bSRI-CAT, Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 83403, USA, and cResearch School of Chemistry, Australian National University, Canberra, ACT 0200, Australia
*Correspondence e-mail: haeffner@aps.anl.gov
In the paper by Butler et al.![[Butler, B. D., Haeffner, D. R., Lee, P. L. & Welberry, T. R. (2000). J. Appl. Cryst. 33, 1046-1050.]](../../../../../../logos/arrows/j_arr.gif "Butler, B. D., Haeffner, D. R., Lee, P. L. & Welberry, T. R. (2000). J. Appl. Cryst. 33, 1046-1050.")
[J. Appl. Cryst. (2000), 33, 1046–1050], Figures 3 and 4 on pages 1047 and 1048 reproduced poorly. Revised versions of these pages are available in the online version of this erratum, which is available through Crystallography Journals Online.
![[Figure 3]](mf2906fig3thm.gif) | Figure 3 Revised figure. Undistorted diffuse scattering image produced from the data displayed in Fig. 2. Here b* is horizontal and c* is vertical. This figure contains data to a scattering angle of 26°, which at photon energies of 45 keV are beyond the accessible wavevector range of a Cu anode source. |
![[Figure 4]](mf2906fig4thm.gif) | Figure 4 Revised figure. Comparison of data collected using a conventional sealed-tube source (Welberry & Mayo, 1998), images (a) and (c), with data recorded at high energies, images (b) and (d). Images (a) and (b) are from the (0kl) layer, while (c) and (d) are from the (1kl) layer. (b) and (d) were recorded with a sample to image-plate distance of 683 mm. |
Supporting information
Revised versions of pages 1047 and 1048 of Butler et al. (2000). DOI: https://doi.org/10.1107/S0021889800013911/mf2906sup1.pdf
References
Butler, B. D., Haeffner, D. R., Lee, P. L. & Welberry, T. R. (2000). J. Appl. Cryst. 33, 1046–1050. Web of Science CrossRef CAS IUCr Journals
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