new commercial products\(\def\hfill{\hskip 5em}\def\hfil{\hskip 3em}\def\eqno#1{\hfil {#1}}\)

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767

Philips Analytical X'Celerator

Philips Analytical announces a new fast X-ray detector, the X'Celerator, offering a 100-fold increase in recording speed for powder diffractometry.[link] Designed for the X'Pert PRO diffractometer series, the X'Celerator is based on the company's new real-time multiple-strip direction technology. This replaces a single detector with an integrated array of parallel detectors to provide up to 100-fold increase in efficiency compared with traditional detectors. This means a scan formerly requiring three hours of data-collection time can now be recorded in less than two minutes, with no compromise on resolution.

[Figure 1]
Figure 1
The Philips Analytical X'Celerator.

The new unit is mounted using the company's proprietary PreFIX interface, a design that allows for easy exchange of optical components without laborious re-alignment procedures. Its design makes for simple, maintenance-free operation. It is available with several options including a diffracted-beam monochromator, a beta filter and exchangeable Soller slits. With its high speed and ultra-high resolution, it is expected to offer advantages and cost savings in almost every powder-diffractometry application such as phase identification and quantification, crystallography and residual stress analysis.

Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds