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Figure 2
Illustration of the tracking principle. Spots arising from the same reflection at different sample–detector distances are identified. Linear fits through these are extrapolated to give the position of the grain within the illuminated layer in the sample. The angles (2θ, η, ω) are defined, as well as the laboratory coordinate system (xl, yl, zl).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 34| Part 6| December 2001| Pages 744-750
https://doi.org/10.1107/S0021889801014170
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