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Figure 7
A comparison of exponential (broken line) and `top hat' (solid line) sampling at 1.5 Å resolution (see Table 7[link]).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 35| Part 4| July 2002| Pages 443-454
doi:10.1107/S0021889802007835
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