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Figure 3
Relative wavelength shift versus tilting angle of the MDCM measured by an analyser silicon crystal. Uncertainty of the wavelength caused by the tilting angle can be easily reduced to less than one part in 106.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 36| Part 2| March 2003| Pages 188-192
doi:10.1107/S0021889802021374
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