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Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767

High-resolution electron microscopy. 3rd edition. By John C. H. Spence. Pp. xvi + 401. Oxford University Press, 2003. GBP 69.95. ISBN 0-19-850915-4.

Keywords: book received.

This third edition of High-Resolution Electron Microscopy is essentially a new book, completely rewritten and much expanded to encompass a host of new developments. At the same time, the author retains and expands the core aspects of dynamical scattering theory that apply across all methods of transmission microscopy. The full review, by Roger Vincent, is published in the September issue of Acta Crystallographica Section A, pages 513–514.

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