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Figure 2
Powder X-ray diffraction patterns taken at 110 K: (a) standard silicon (∼1 µg, 1440 s), (b) standard silicon (∼5–10 ng, 8640 s), and (c) CaSO4 (∼1 µg, 2160 s). Vertical lines represent the peak positions of the reported powder patterns for the corresponding materials (Si: JCPDS-ICDD number 27-1402; CaSO4: JCPDS-ICDD number 37-1496) obtained from the search/match feature of the EVA program. In (a) and (c), Miller indices for selected peaks are given in parentheses.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 36| Part 6| December 2003| Pages 1480-1481
https://doi.org/10.1107/S0021889803021885
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