view article
Figure 6
Diffuse scattering intensity versus 2sin(θ)/λ and resolution for a 20 µm thick nylon loop and a 9 µm thick polyimide mount when illuminated using a 12.7 keV X-ray beam focused to a 10 µm spot. For the nylon loop, the spot was focused on the middle of the nylon line and for the polyimide film the spot was focused normal to the plane of the film.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 36| Part 6| December 2003| Pages 1455-1460
https://doi.org/10.1107/S0021889803018375
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS