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Figure 3
Views of (a) the instrument and (b) the axis system. The low-temperature device [the nozel of which is visible in the top part of (a)] was not used for the experiments described here.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 37| Part 3| May 2004| Pages 410-416
doi:10.1107/S0021889804007149
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