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Figure 3
The integrated intensity (solid symbols) and background (open symbols) count rates (normalized by Vv) and the associated predictions (continuous and dashed lines, respectively) for depth scans on (a) Al (311), (b) Ti (10[\bar{1}]1), (c) Fe (200) and (211), and (d) Ni (111) recorded in reflection geometry on ID31 at 60 keV (ESRF). The data represented by square symbols were collected during the same beam period and are modelled by the bolder lines. The other data were collected at various times during the previous 15 months. The Φinstr, β0 and βsample instrumental parameters were obtained from the Ni data. The path lengths have been normalized by the respective attenuation lengths.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 37| Part 4| July 2004| Pages 596-606
doi:10.1107/S0021889804012737
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