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Figure 4
Acquisition times to achieve 10−4 strain accuracy using neutron (Chalk River L3) and various synchrotron instruments with an Al sampling gauge of 1 mm3 for synchrotrons and 40 mm3 for neutrons as a function of (a) normalized path length and (b) depth in reflection geometry using the angles and peak widths given in Table 4 of part I. The dashed curves show the corresponding background penalty factors [1 + 2(2)1/2b/hhkl] for neutrons and ID31. The dashed horizontal lines delineate the 1 h (left-hand axis) and peak to background ratio of 1 maximum feasible depth criteria (right-hand axis).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 37| Part 4| July 2004| Pages 607-612
doi:10.1107/S0021889804012750
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