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Figure 1
The Pattern Editor window in SNAP-1D. The options to subtract the background, find the peaks, set the peak level and smooth the data using wavelets are all set here. If CIF or raw files are used as the data source, extra data fields can be examined. The Advanced tab allows the input of unit-cell dimensions and contents for quantitative analysis to obtain the weight percentage. Multiple excluded regions in 2θ can also be defined here.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 37| Part 4| July 2004| Pages 665-668
doi:10.1107/S0021889804011847
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