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Figure 4
Comparison of (left) the diffraction pattern of B-DNA simulated using HELIX and the parameters discussed above and (right) a recorded X-ray diffraction pattern from a fibre tilted to bring the 3.4 Å meridional reflection (m = 1) into the diffraction condition (unpublished pattern recorded by JMS). This tilting explains why the diffraction features at the top of the recorded pattern are so strong. The HELIX program, even with a very simple structure, simulates quite well the relative strengths of the different layer-lines. However, it does not show the observed sampling of the layer-lines along vertical row-lines, since lattice sampling effects have not been included. Here we are simulating the diffraction from a single molecule which consists of unsampled layer-lines.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 37| Part 5| September 2004| Pages 832-835
doi:10.1107/S0021889804016048
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