X-ray scattering from semiconductors . 2nd edition. By Paul F. Fewster. World Scientific Publishing, 2003, pp. 316. Price USD 76, GBP 56. ISBN 1 86094 360 8.

This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general.