Size–strain line-broadening analysis of the ceria round-robin sample

Balzar, D.; Audebrand, N.; Daymond, M.R.; Fitch, A.; Hewat, A.; Langford, J.I.; Le Bail, A.; Louër, D.; Masson, O.; McCowan, C.N.; Popa, N.C.; Stephens, P.W.; Toby, B.H.

doi:10.1107/S0021889804022551

Journal of Applied Crystallography Journal of Applied
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Figure 1
FWHM versus diffraction angle, as obtained from laboratory X-ray measurements, for three samples: CeO₂ with broadened lines (sample S1), annealed CeO₂ used to correct for instrumental effects (sample S2), and new NIST SRM660a LaB₆.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 37| Part 6| November 2004| Pages 911-924

doi:10.1107/S0021889804022551

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