Journal of Applied Crystallography
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Figure 2
Resolution function
Δ
d
/
d
as a function of interplanar spacing
d
for all instruments, as calculated from the FWHM obtained by Rietveld refinement, for the sample S2.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 37
|
Part 6
|
November 2004
|
Pages 911-924
doi:10.1107/S0021889804022551
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