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Figure 1
Concept of diffraction stress analysis. When a polycrystal is subjected to stress (in this case a uniaxial compression parallel to the surface), the lattice spacing of the hkl lattice planes varies with the orientation of the lattice planes with respect to the loading direction. This direction-dependent lattice strain can be measured by X-ray diffraction. The direction of the strain measurement is the direction of the diffraction vector and is identified by the angles φ and ψ, where φ is the rotation angle of the specimen about the specimen surface normal and ψ is the inclination angle of the specimen surface normal with respect to the diffraction vector.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 38| Part 1| January 2005| Pages 1-29
doi:10.1107/S0021889804029516
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