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Figure 10
Stress analysis employing the f(ψ, hkl) method: calculated example. Lattice strain for the 111, 200, 220, 311, 222, 400, 321 and 420 reflections of a macroscopically elastically isotropic copper specimen subjected to the mechanical stress state with [\langle \sigma _{11}^{\rm S} \rangle ] = [\langle {\sigma _{22}^{\rm S} } \rangle] = 100 MPa (all other components are zero): (a) plot of [\varepsilon _{\psi}^{hkl}] versus sin2ψ and (b) plot of [\varepsilon _{\psi}^{hkl}] versus f(ψ, hkl). Tilt angles for the individual reflections as shown in (a) would be obtained if a measurement is conducted as a 2θ scan at a fixed small incidence angle (cf. §3[link]). For details, see text.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 38| Part 1| January 2005| Pages 1-29
doi:10.1107/S0021889804029516
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