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Figure 12
Stress analysis employing a general least-squares analysis: practical example. Lattice spacing for the 111 (a) and 200 (b) reflections of a macroscopically elastically isotropic copper specimen (practically untextured thin film of thickness of about 0.5 µm, produced by physical vapour deposition). Fitting was performed using one independent stress tensor component: [\langle {\sigma _{11}^{\rm S} } \rangle] = [\langle {\sigma _{22}^{\rm S} } \rangle] (all other components are zero). In addition, the strain-free lattice spacings for the {111} and {200} planes were used as fit parameters in order to fit data on the basis of lattice spacing instead of lattice strains. The result is: [\langle {\sigma _{11}^{\rm S} } \rangle] = [\langle {\sigma _{22}^{\rm S} } \rangle] = 282 ± 7 MPa. The strain-free lattice spacings are used only as dummy parameters. They could be used for the determination of the strain-free lattice constants only after correction for instrumental aberrations (cf. §4.4.1[link]).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 38| Part 1| January 2005| Pages 1-29
doi:10.1107/S0021889804029516
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