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Figure 14
Textured copper film. Measured (open circles) and simulated (dashed line) diffraction strain data for two reflections as function of sin2ψ (sin2ψ plots). For details of the simulation, see text. The error bars indicating statistical errors on the lattice strains are about twice the size of the circles for the 200 reflection and less than the size of the circles for the 420 reflection.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 38| Part 1| January 2005| Pages 1-29
doi:10.1107/S0021889804029516
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