view article
Figure 5
Penetration depth, τ (1/e definition), for Cu Kα radiation in Si and Au versus the angle of incidence, α, of the X-ray beam calculated according to Parrat (1954BB67). In the vicinity of the critical angle, αC, for total reflection, a strong variation of τ occurs.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 38| Part 1| January 2005| Pages 1-29
doi:10.1107/S0021889804029516
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS