Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 6
Diffraction intensities
versus
sample rotation angle and TOF. The expected positions of Cu(200), Fe(110) and Al(111) are drawn as vertical dashed lines.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 39
|
Part 1
|
February 2006
|
Pages 82-89
https://doi.org/10.1107/S0021889805041580
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