Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 5
Porod representation of the X-ray scattering from a 3% (
w
/
w
) silica suspension, shown in Fig. 4
.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 39
|
Part 1
|
February 2006
|
Pages 32-38
https://doi.org/10.1107/S0021889805033091
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