Journal of Applied Crystallography
Journal of Applied
Crystallography
IUCr
IT
WDC
search term
home
archive
editors
for authors
for readers
submit
subscribe
open access
journal menu
home
archive
editors
for authors
for readers
submit
subscribe
open access
disable zoom
view article
Figure 7
Si(111) analyzer rocking curve in the dispersive (1, −1, 1, −1, −1) setting collected at 13 keV in the bent–bent configuration. The experimental points (dots) were fitted to a pure Gaussian profile (line).
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 39
|
Part 3
|
May 2006
|
Pages 347-357
doi:10.1107/S0021889806009319
Follow J. Appl. Cryst.
E-alerts
Twitter
Facebook
RSS